Applus+ can perform the various methods of leak testing for non-destructive testing (NDT) on new components, according to the specified codes and procedure, or work with a customer to assist in locating leaks within their operating systems and existing assets.
Leaks from installations and systems can adversely impact the environment, system performance and/or a company’s revenues due to the loss of product and significant downtime.
Helium leak mass spectrometer test is a way to detect very small leaks across a pressure boundary.
Bubble leak testing is used to find leaks in many different components. The two most common forms of bubble leak testing are the direct-pressure technique and the vacuum-box technique. The direct-pressure technique is conducted by pressurising a component with a gas and then either submerging it in a solution or applying a solution to the outside of the component. If a leak is present, bubbles will form on the surface because of the leaking gas passing through the solution. The vacuum-box technique is conducted on parts that cannot be directly pressurised or where access is not available to both sides of a component. The test is conducted by applying a solution to an area of a pressure-boundary surface and creating a differential pressure across the area, causing the formation of bubbles as leakage gas, such as atmospheric air, passes through the solution.
The Halogen diode detector probe test is a method to conduct a leak inspection by using a tracer gas and a detector probe to detect the presence of halogen. The detection of halogen across a pressure boundary would indicate the presence of a leak.