Applus+ can perform the various methods of leak testing for non-destructive testing (NDT) on new components, according to the specified codes and procedure, or work with a customer to assist in locating leaks within their operating systems and existing assets.
Leaks from installations and systems can adversely impact the environment, system performance and/or a company’s revenues due to the loss of product and significant downtime.
Bubble leak testing is used to find leaks in many different components. The two most common forms of bubble leak testing are the direct-pressure technique and the vacuum-box technique. The direct-pressure technique is conducted by pressurising a component with a gas and then either submerging it in a solution or applying a solution to the outside of the component. If a leak is present, bubbles will form on the surface because of the leaking gas passing through the solution. The vacuum-box technique is conducted on parts that cannot be directly pressurised or where access is not available to both sides of a component. The test is conducted by applying a solution to an area of a pressure-boundary surface and creating a differential pressure across the area, causing the formation of bubbles as leakage gas, such as atmospheric air, passes through the solution.
The Halogen diode detector probe test is a method to conduct a leak inspection by using a tracer gas and a detector probe to detect the presence of halogen. The detection of halogen across a pressure boundary would indicate the presence of a leak.